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  1/61 august 2004 m58lw064c 64 mbit (4mb x 16, uniform block, burst) 3v supply flash memory features summary wide x16 data bus for high bandwidth supply voltage ?v dd = 2.7 to 3.6v core supply voltage for program, erase and read operations ?v ddq = 1.8 to v dd for i/o buffers synchronous/asynchronous read ? synchronous burst read ? asynchronous random read ? asynchronous address latch controlled read ? page read access time ? synchronous burst read up to 56mhz ? asynchronous page mode read 110/ 25ns ? random read 110ns programming time ? 16 word write buffer ? 12s word effective programming time 64 uniform 64 kword memory blocks enhanced security ? block protection/ unprotection ? smart protection: irreversible block locking system ?v pen signal for program erase enable ? 128 bit protection register with 64 bit unique code in otp area program and erase suspend common flash interface 100,000 program/erase cycles per block electronic signature ? manufacturer code: 0020h ? device code m58lw064c : 8820h packages ? compliant with lead-free soldering processes ? lead-free versions figure 1. packages tsop56 (n) 14 x 20 mm tbga64 (za) 10 x 13 mm tbga
m58lw064c 2/61 table of contents features summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 figure 1. packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 summary description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 figure 2. logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 table 1. signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 figure 3. tsop56 connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 figure 4. tbga64 connections (top view through package) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 figure 5. block addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 signal descriptions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 address inputs (a1-a22). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 data inputs/outputs (dq0-dq15). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11 chip enable (e ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .11 output enable (g ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 write enable (w ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 1 reset/power-down (rp ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 latch enable (l ). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 clock (k).. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 valid data ready (r). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 status/(ready/busy) (sts) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 program/erase enable (vpen). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 v dd supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 v ddq supply voltage. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 v ss ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 v ssq ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 bus operations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 address latch.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 bus read. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 bus write. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 output disable. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 power-down. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 standby. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 table 2. bus operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 read modes. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 asynchronous read modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14 asynchronous latch controlled read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 asynchronous random read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 asynchronous page read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 synchronous read modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .14 synchronous burst read. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
3/61 m58lw064c single synchronous read . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 configuration register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 read select bit (cr15) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 x-latency bits (cr13-cr11). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 internal clock divider bit (cr10). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 y-latency bit (cr9). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 valid data ready bit (cr8). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 burst type bit (cr7). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 valid clock edge bit (cr6). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 burst length bit (cr2-cr0). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 table 3. configuration register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 table 4. burst type definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 figure 6. burst configuration x-1-1-1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18 figure 7. burst configuration x-2-2-2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 command interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 read memory array command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 read electronic signature command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 0 read query command.. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 read status register command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 clear status register command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 block erase command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 word program command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 write to buffer and program command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 program/erase suspend command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 program/erase resume command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 set configuration register command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 block protect command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 blocks unprotect command. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 protection register program command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 configure sts command . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 table 5. commands . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 table 6. configuration codes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 table 7. read electronic signature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 table 8. read protection register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .24 figure 8. protection register memory map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 table 9. program, erase times and program erase endurance cycles . . . . . . . . . . . . . . . . . . . 25 status register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 program/erase controller status bit (sr7) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 6 erase suspend status bit (sr6) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 erase status bit (sr5) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 program status bit (sr4) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26 v pen status bit (sr3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 program suspend status bit (sr2) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .27
m58lw064c 4/61 block protection status bit (sr1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 reserved (sr0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 table 10. status register bits . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 maximum rating. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 table 11. absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 dc and ac parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 table 12. operating and ac measurement conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 figure 9. ac measurement input output waveform. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 figure 10.ac measurement load circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 table 13. capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 table 14. dc characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 figure 11.asynchronous random read ac waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 table 15. asynchronous random read ac characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 figure 12.asynchronous latch controlled read ac waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . 32 table 16. asynchronous latch controlled read ac characteristics . . . . . . . . . . . . . . . . . . . . . . . 33 figure 13.asynchronous page read ac waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 table 17. asynchronous page read ac characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 figure 14.asynchronous write ac waveform, write enable controlled . . . . . . . . . . . . . . . . . . . . . 34 figure 15.asynchronous latch controlled write ac waveform, write enable controlled . . . . . . . 35 table 18. asynchronous write and latch controlled write ac characteristics, w controlled. . . . 36 figure 16.asynchronous write ac waveforms, chip enable controlled . . . . . . . . . . . . . . . . . . . . 37 figure 17.asynchronous latch controlled write ac waveforms, chip enable controlled . . . . . . . 37 table 19. asynchronous write and latch controlled write ac characteristics, e controlled . . 38 figure 18.synchronous burst read ac waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 figure 19.synchronous burst read, continuous, valid data ready output . . . . . . . . . . . . . . . . . 40 table 20. synchronous burst read ac characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 figure 20.reset, power-down and power-up ac waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 table 21. reset, power-down and power-up ac characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 41 package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 figure 21.tsop56 - 56 lead plastic thin small outline, 14 x 20 mm, package outline . . . . . . . . 42 table 22. tsop56 - 56 lead plastic thin small outline, 14 x 20 mm, package mechanical data . 42 figure 22.tbga64 10x13mm - 8x8 ball array, 1mm pitch, package outline . . . . . . . . . . . . . . . . . 43 table 23. tbga64 10x13mm - 8x8 ball array, 1mm pitch, package mechanical data . . . . . . . . . . 43 part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44 table 24. ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 4 appendix a.block address table . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 table 25. block addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 appendix b.common flash interface - cfi . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 table 26. query structure overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .46
5/61 m58lw064c table 27. cfi - query address and data output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 table 28. cfi - device voltage and timing specification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 table 29. device geometry definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .47 table 30. block status register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 table 31. extended query information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49 appendix c.flow charts . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 figure 23.write to buffer and program flowchart and pseudo code . . . . . . . . . . . . . . . . . . . . . . . 50 figure 24.program suspend & resume flowchart and pseudo code . . . . . . . . . . . . . . . . . . . . . . 51 figure 25.erase flowchart and pseudo code. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 figure 26.erase suspend & resume flowchart and pseudo code . . . . . . . . . . . . . . . . . . . . . . . . 53 figure 27.block protect flowchart and pseudo code . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 54 figure 28.block unprotect flowchart and pseudo code. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 figure 29.protection register program flowchart and pseudo code. . . . . . . . . . . . . . . . . . . . . . . 56 figure 30.command interface and program erase controller flowchart (a) . . . . . . . . . . . . . . . . . 57 figure 31.command interface and program erase controller flowchart (b) . . . . . . . . . . . . . . . . . 58 figure 32.command interface and program erase controller flowchart (c). . . . . . . . . . . . . . . . . . 59 revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 table 32. document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60
m58lw064c 6/61 summary description m58lw064c is a 64 mbit (4mb x16) non-volatile memory that can be read, erased and repro- grammed. these operations can be performed us- ing a single low voltage (2.7v to 3.6v) core supply. on power-up the memory defaults to read mode with an asynchronous bus where it can be read in the same way as a non-burst flash memory. the memory is divided into 64 blocks of 1mbit that can be erased independently so it is possible to preserve valid data while old data is erased. pro- gram and erase commands are written to the command interface of the memory. an on-chip program/erase controller simplifies the process of programming or erasing the memory by taking care of all of the special operations that are re- quired to update the memory contents. the end of a program or erase operation can be detected and any error conditions identified in the status regis- ter. the command set required to control the memory is consistent with jedec standards. the device supports synchronous burst read and asynchronous read from all blocks of the memory array; at power-up the device is configured for asynchronous read. in asynchronous mode an address latch input can be used to latch address- es in latch controlled mode. in synchronous burst mode, data is output on each clock cycle at fre- quencies of up to 56mhz. the write buffer allows the microprocessor to pro- gram from 1 to 16 words in parallel, both speeding up the programming and freeing up the micropro- cessor to perform other work. a word program command is available to program a single word. erase can be suspended in order to perform either read or program in any other block and then re- sumed. program can be suspended to read data in any other block and then resumed. each block can be programmed and erased over 100,000 cycles. the m58lw064c has several security features to increase data protection. block protection, where each block can be individually protected against program or erase operations. all blocks are protected during power-up. the protection of the blocks is non-volatile; after power-up the protection status of each block is restored to the state when power was last removed. program erase enable input v pen , program or erase operations are not possible when the program erase enable input v pen is low. smart protection, which allows protected blocks to be permanently locked. this feature is not described in the datasheet for security reasons. please contact stmicroelectronics for further details. 128 bit protection register, divided into two 64 bit segments: the first contains a unique device number written by st, the second is user programmable. the user programmable segment can be protected. the reset/power-down pin is used to apply a hardware reset to the memory and to set the de- vice in power-down mode. the device features an auto low power mode. if the bus becomes inactive during asynchronous read operations, the device automatically enters auto low power mode. in this mode the power consumption is reduced to the auto low power supply current. the sts signal is an open drain output that can be used to identify the program/erase controller sta- tus. it can be configured in two modes: ready/ busy mode where a static signal indicates the sta- tus of the p/e.c, and status mode where a pulsing signal indicates the end of a program or block erase operation. in status mode it can be used as a system interrupt signal, useful for saving cpu time. the memory is available in tsop56 (14 x 20 mm) and tbga64 (10 x 13mm, 1mm pitch) packages. in addition to the standard version, the packages are also available in lead-free version, in compli- ance with jedec std j-std-020b, the st eco- pack 7191395 specification, and the rohs (restriction of hazardous substances) directive. all packages are compliant with lead-free solder- ing processes.
7/61 m58lw064c figure 2. logic diagram table 1. signal names ai06205 22 a1-a22 w dq0-dq15 v dd m58lw064c e v ss 16 g rp k v ddq v pen v ssq sts l r a1-a22 address inputs dq0-dq15 data inputs/outputs e chip enable g output enable kclock l latch enable r valid data ready sts status/(ready/busy) rp reset/power-down v pen program/erase enable w write enable v dd supply voltage v ddq input/output supply voltage v ss ground v ssq input/output ground nc not connected internally
m58lw064c 8/61 figure 3. tsop56 connections dq3 dq9 dq2 dq0 dq6 a16 a17 a18 dq14 dq12 dq10 sts v ddq dq4 dq7 ai06206 m58lw064c 14 1 15 28 29 42 43 56 dq8 v dd dq1 dq11 nc a20 a21 nc a19 w a22 r e l k a6 a3 a8 a9 a10 a2 a7 v pen a1 a4 a5 a12 a13 a11 a15 a14 rp v ss nc dq13 dq15 v dd dq5 g v ss v ssq
9/61 m58lw064c figure 4. tbga64 connections (top view through package) ai06207b dq6 a1 v ss v dd dq10 v dd dq7 dq5 v ddq dq2 h dq14 v ssq dq13 d a16 a20 e a9 c a17 a21 a11 a15 k a8 b r a19 a2 a13 a14 a 8 7 6 5 4 3 2 1 a7 a3 a4 a5 g f e dq0 l a6 v pen a22 a18 a10 a12 rp dq15 sts dq9 dq8 dq1 dq4 dq3 g dq12 dq11 w v ss nc nc nc nc nc nc nc nc nc nc nc
m58lw064c 10/61 figure 5. block addresses note: also see appendix a , table 25 for a full listing of the block addresses ai06222 3fffffh 3f0000h 01ffffh 010000h 00ffffh 000000h word (x16) bus width 3effffh 3e0000h total of 64 1 mbit blocks 1 mbit or 64 kwords 1 mbit or 64 kwords 1 mbit or 64 kwords 1 mbit or 64 kwords
11/61 m58lw064c signal descriptions see figure 2., logic diagram , and table 1., signal names , for a brief overview of the sig- nals connected to this device. address inputs (a1-a22). the address inputs are used to select the cells to access in the mem- ory array during bus read operations either to read or to program data to. during bus write oper- ations they control the commands sent to the command interface of the internal state machine. chip enable and latch enable must be low when selecting the addresses. the address inputs are latched on the rising edge of chip enable, write enable or latch enable, whichever occurs first in a write operation. the address latch is transparent when latch enable is low, v il . the address is internally latched in an erase or program operation. data inputs/outputs (dq0-dq15). the data in- puts/outputs output the data stored at the selected address during a bus read operation, or are used to input the data during a program operation. dur- ing bus write operations they represent the com- mands sent to the command interface of the internal state machine. when used to input data or write commands they are latched on the rising edge of write enable or chip enable, whichever occurs first. when chip enable and output enable are both low, v il , the data bus outputs data from the mem- ory array, the electronic signature, the block pro- tection status, the cfi information or the contents of the status register. the data bus is high imped- ance when the chip is deselected, output enable is high, v ih, or the reset/power-down signal is low, v il . when the program/erase controller is active the ready/busy status is given on dq7. chip enable (e ). the chip enable, e , input acti- vates the memory control logic, input buffers, de- coders and sense amplifiers. chip enable, e , at v ih deselects the memory and reduces the power consumption to the standby level, i dd1 . output enable (g ). the output enable, g , gates the outputs through the data output buffers during a read operation. when output enable, g , is at v ih the outputs are high impedance. output enable, g , can be used to inhibit the data output during a burst read operation. write enable (w ). the write enable input, w , controls writing to the command interface, input address and data latches. both addresses and data can be latched on the rising edge of write en- able (also see latch enable, l ). reset/power-down (rp ). the reset/power- down pin can be used to apply a hardware reset to the memory. a hardware reset is achieved by holding reset/ power-down low, v il , for at least t plph . when reset/power-down is low, v il , the status regis- ter information is cleared and the power consump- tion is reduced to power-down level. the device is deselected and outputs are high impedance. if re- set/power-down goes low, v il ,during a block erase, a write to buffer and program or a block protect/unprotect the operation is aborted and the data may be corrupted. in this case the ready/ busy pin stays low, v il , for a maximum timing of t plph + t phrh, until the completion of the reset/ power-down pulse. after reset/power-down goes high, v ih , the memory will be ready for bus read and bus write operations after t phqv . note that ready/busy does not fall during a reset, see ready/busy out- put section. in an application, it is recommended to associate reset/power-down pin, rp , with the reset signal of the microprocessor. otherwise, if a reset opera- tion occurs while the memory is performing an erase or program operation, the memory may out- put the status register information instead of be- ing initialized to the default asynchronous random read. latch enable (l ). the bus interface is config- ured to latch the address inputs on the rising edge of latch enable, l . in synchronous bus operations the address is latched on the active edge of the clock when latch enable is low, v il or on the ris- ing of latch enable, whichever occurs first. once latched, the addresses may change without affect- ing the address used by the memory. when latch enable is low, v il , the latch is transparent. clock (k). the clock, k, is used to synchronize the memory with the external bus during synchro- nous read operations. the clock can be config- ured to have an active rising or falling edge. bus signals are latched on the active edge of the clock during synchronous bus operations. in synchro- nous burst read mode the address is latched on the first active clock edge when latch enable is low, v il , or on the rising edge of latch enable, whichever occurs first. during asynchronous bus operations the clock is not used. valid data ready (r). the valid data ready output, r, is an open drain output that can be used to identify if the memory is ready to output data or not. the valid data ready output is only active during synchronous burst read operations when the burst length is set to continuous. the valid data ready output can be configured to be active on the clock edge of the invalid data read cycle or one cycle before. valid data ready low, v ol , in-
m58lw064c 12/61 dicates that the data is not, or will not be valid. val- id data ready in a high-impedance state indicates that valid data is or will be available. unless synchronous burst read has been select- ed, valid data ready is high-impedance. it may be tied to other components with the same valid data ready signal to create a unique system ready signal. the valid data ready, r, output has an internal pull-up resistor of approximately 1 m ? powered from v ddq , designers should use an external pull- up resistor of the correct value to meet the external timing requirements for valid data ready rising. refer to figure 19 . status/(ready/busy) (sts). the sts signal is an open drain output that can be used to identify the program/erase controller status. it can be configured in two modes: ready/busy - the pin is low, v ol , during program and erase operations and high impedance when the memory is ready for any read, program or erase operation. status - the pin gives a pulsing signal to indicate the end of a program or block erase operation. after power-up or reset the sts pin is configured in ready/busy mode. the pin can be configured for status mode using the configure sts com- mand. when the program/erase controller is idle, or sus- pended, sts can float high through a pull-up re- sistor. the use of an open-drain output allows the sts pins from several memories to be connected to a single pull-up resistor (a low will indicate that one, or more, of the memories is busy). sts is not low during a reset unless the reset was applied when the program/erase controller was active. ready/busy can rise before reset/power- down rises. program/erase enable (v pen ). the program/ erase enable input, v pen, is used to protect all blocks, preventing program and erase operations from affecting their data. program/erase enable must be kept high during all program/erase controller operations, other- wise the operations is not guaranteed to succeed and data may become corrupt. v dd supply voltage. v dd provides the power supply to the internal core of the memory device. it is the main power supply for all operations (read, program and erase). v ddq supply voltage. v ddq provides the power supply to the i/o pins and enables all outputs to be powered independently from v dd . v ddq can be tied to v dd or can use a separate supply. it is recommended to power-up and power-down v dd and v ddq together to avoid any condition that would result in data corruption. v ss ground. ground, v ss, is the reference for the core power supply. it must be connected to the system ground. v ssq ground. v ssq ground is the reference for the input/output circuitry driven by v ddq . v ssq must be connected to v ss . note: each device in a system should have v dd and v ddq decoupled with a 0.1f ceramic capacitor close to the pin (high frequency, in- herently low inductance capacitors should be as close as possible to the package). see fig- ure 10., ac measurement load circuit .
13/61 m58lw064c bus operations there are six standard bus operations that control the device. these are address latch, bus read, bus write, output disable, power-down and standby. see table 2., bus operations , for a sum- mary. typically glitches of less than 5ns on chip enable or write enable are ignored by the memory and do not affect bus write operations. address latch. address latch operations input valid addresses. a valid bus operation involves setting the desired address on the address inputs, setting chip en- able and latch enable low, v il and keeping write enable high, v ih ; the address is latched on the ris- ing edge of address latch. bus read. bus read operations are used to out- put the contents of the memory array, the elec- tronic signature, the status register, the common flash interface and the block protection status. a valid bus operation involves setting the desired address on the address inputs, applying a low signal, v il , to chip enable, output enable and latch enable and keeping write enable high, v ih . the data read depends on the previous command written to the memory (see command interface section). see figures 11 , 12 , 13 , 18 and 19 read ac waveforms, and tables 15 , 16 , 17 and 20 read ac characteristics, for details of when the output becomes valid. bus write. bus write operations write com- mands to the memory or latch addresses and input data to be programmed. a valid bus write operation begins by setting the desired address on the address inputs and setting latch enable low, v il . the address inputs are latched by the command interface on the rising edge of chip enable or write enable, whichever occurs first. the data inputs/outputs are latched by the command interface on the rising edge of chip enable or write enable, whichever occurs first. output enable must remain high, v ih , during the bus write operation. see figures 14 , 15 , 16 and 17 , write ac wave- forms, and tables 18 and 19 , write ac character- istics, for details of the timing requirements. output disable. the data inputs/outputs are high impedance when the output enable is at v ih . power-down. the memory is in power-down mode when reset/power-down, rp , is low. the power consumption is reduced to the power-down level, i dd2 , and the outputs are high impedance, independent of chip enable, output enable or write enable. standby. standby disables most of the internal circuitry, allowing a substantial reduction of the current consumption. the memory is in standby when chip enable is at v ih . the power consump- tion is reduced to the standby level i dd1 and the outputs are set to high impedance, independently from the output enable or write enable inputs. if chip enable switches to v ih during a program or erase operation, the device enters standby mode when finished. table 2. bus operations note: 1. x = don?t care v il or v ih . 2. depends on g operation e g w rp l a1-a22 dq0-dq15 address latch v il x v ih v ih v il address data output or hi-z (2) bus read v il v il v ih v ih v il address data output bus write v il v ih v il v ih v il address data input output disable v il v ih v ih v ih xx high z power-down x x x v il xx high z standby v ih xx v ih xx high z
m58lw064c 14/61 read modes read operations can be performed in two different ways depending on the settings in the configura- tion register. if the clock signal is ?don?t care? for the data output, the read operation is asynchro- nous; if the data output is synchronized with clock, the read operation is synchronous. the read mode and format of the data output are determined by the configuration register. (see configuration register section for details). on power-up or after a hardware reset the mem- ory defaults to asynchronous read mode. asynchronous read modes in asynchronous read operations the clock signal is ?don?t care?. the device outputs the data corre- sponding to the address latched, that is the mem- ory array, status register, common flash interface, electronic signature or block protection status depending on the command issued. cr15 in the configuration register must be set to ?1? for asynchronous operations. during asynchronous read operations, if the bus is inactive for a time equivalent to t avqv , the de- vice automatically enters auto low power mode. in this mode the internal supply current is reduced to the auto low power supply current, i dd5 . the data inputs/outputs will still output data if a bus read operation is in progress. automatic low power is only available in asyn- chronous read modes. asynchronous read operations can be performed in three different ways, asynchronous latch con- trolled read, asynchronous random read and asynchronous page read. asynchronous latch controlled read. in asynchronous latch controlled read opera- tions read the address is latched in the memory before the value is output on the data bus, allowing the address to change during the cycle without af- fecting the address that the memory uses. a valid bus operation involves setting the desired address on the address inputs, setting chip en- able and latch enable low, v il and keeping write enable high, v ih ; the address is latched on the ris- ing edge of address latch. once latched, the ad- dress inputs can change. set output enable low, v il , to read the data on the data inputs/outputs. see figure 12., asynchronous latch controlled read ac waveforms , and table 16., asynchronous latch controlled read ac characteristics , for details. asynchronous random read. as the latch en- able input is transparent when set low, v il , asyn- chronous random read operations can be performed by holding latch enable low, v il throughout the bus operation. see figure 11., asynchronous random read ac waveforms , and table 15., asynchronous ran- dom read ac characteristics. , for details. asynchronous page read. in asynchronous page read mode a page of data is internally read and stored in a page buffer. each memory page is 4 words and has the same a3-a22, only a1 and a2 may change. the first read operation within the page has the normal access time (t avqv ), subsequent reads within the same page have much shorter access times (t avqv1 ). if the page changes then the nor- mal, longer timings apply again. see figure 13., asynchronous page read ac waveforms , and table 17., asynchronous page read ac characteristics , for details. synchronous read modes in synchronous read mode the data output is syn- chronized with the clock. cr15 in the configura- tion register must be set to ?0? for synchronous operations. synchronous burst read. in synchronous burst read mode the data is output in bursts syn- chronized with the clock. it is possible to perform burst reads across bank boundaries. synchronous burst read mode can only be used to read the memory array. for other read opera- tions, such as read status register, read cfi, read electronic signature and block protection status, single synchronous read or asynchro- nous read must be used. in synchronous burst read mode the flow of the data output depends on parameters that are con- figured in the configuration register. a valid synchronous burst read operation begins when the address is set on the address inputs, write enable is high, v ih , and chip enable and latch enable are low, v il , during the active edge of the clock. the address is latched on the first ac- tive clock edge when latch enable is low, or on the rising edge of latch enable, whichever occurs first. the data becomes available for output after the x-latency specified in the burst control regis- ter has expired. the output buffers are activated by setting output enable low, v il . see figures 6 and 7 for examples of synchronous burst read operations. the number of words to be output during a syn- chronous burst read operation can be configured as 4 words, 8 words or continuous (burst length bits cr2-cr0). in synchronous continuous burst read mode one burst read operation can access the entire memory sequentially. if the starting ad- dress is not associated with a page (4 word) boundary the valid data ready, r, output goes
15/61 m58lw064c low, v il , to indicate that the data will not be ready in time and additional wait-states are required. the valid data ready output timing (bit cr8) can be changed in the configuration register. the order of the data output can be modified through the burst type bit in the configuration register. the burst sequence can be sequential or interleaved. see table 20., synchronous burst read ac char- acteristics , and figure 18 and 19 , synchronous burst read ac waveform for details. single synchronous read. single synchro- nous read operations are similar to synchronous burst read operations except that only the first data output after the x latency is valid. single syn- chronous reads are used to read the status reg- ister, cfi, electronic signature and block protection status.
m58lw064c 16/61 configuration register the configuration register is used to configure the type of bus access that the memory will per- form. the configuration register bits are de- scribed in table 3 . they specify the selection of the burst length, burst type, burst x and y laten- cies and the read operation. see figures 6 and 7 for examples of synchronous burst read configu- rations. the configuration register is set through the command interface and will retain its information until it is re-configured, the device is reset, or the device goes into reset/power-down mode. the configuration register is read using the read electronic signature command at address 05h. read select bit (cr15). the read select bit, cr15, is used to switch between asynchronous and synchronous read operations. when the read select bit is set to ?1?, read operations are asyn- chronous; when the read select but is set to ?0?, read operations are synchronous. on reset or power-up the read select bit is set to ?1? for asynchronous access. x-latency bits (cr13-cr11). the x-latency bits are used during synchronous read operations to set the number of clock cycles between the ad- dress being latched and the first data becoming available. for correct operation the x-latency bits can only assume the values in table 3., configuration register . internal clock divider bit (cr10). the internal clock divider bit is used to divide the internal clock by two. when cr10 is set to ?1? the internal clock is divided by two, which effectively means that the x and y-latency values are multiplied by two, that is the number of clock cycles between the address being latched and the first data becoming avail- able will be twice the value set in cr13-cr11, and the number of clock cycles between consecutive reads will be twice the value set in cr9. for exam- ple 8-1-1-1 will become 16-2-2-2. when cr10 is set to ?0? the internal clock runs normally and the x and y-latency values are those set in cr13-cr11 and cr9. y-latency bit (cr9). the y-latency bit is used during synchronous read operations to set the number of clock cycles between consecutive reads. the y-latency value depends on both the x-latency value and the setting in cr9. when the y-latency is 1 the data changes each clock cycle; when the y-latency is 2 the data changes every second clock cycle. see table 3., configuration register for valid combinations of the y-latency, the x-latency and the clock fre- quency. valid data ready bit (cr8). the valid data ready bit controls the timing of the valid data ready output pin, r. when the valid data ready bit is ?0? the valid data ready output pin is driven low for the active clock edge when invalid data is output on the bus. when the valid data ready bit is ?1? the valid data ready output pin is driven low one clock cycle prior to invalid data being output on the bus. burst type bit (cr7). the burst type bit is used to configure the sequence of addresses read as sequential or interleaved. when the burst type bit is ?0? the memory outputs from interleaved ad- dresses; when the burst type bit is ?1? the memory outputs from sequential addresses. see table 4., burst type definition , for the sequence of ad- dresses output from a given starting address in each mode. valid clock edge bit (cr6). the valid clock edge bit, cr6, is used to configure the active edge of the clock, k, during synchronous burst read operations. when the valid clock edge bit is ?0? the falling edge of the clock is the active edge; when the valid clock edge bit is ?1? the rising edge of the clock is active. burst length bit (cr2-cr0). the burst length bits set the maximum number of words that can be output during a synchronous burst read oper- ation. table 3., configuration register gives the valid combinations of the burst length bits that the memory accepts; table 4., burst type definition , give the sequence of addresses output from a giv- en starting address for each length. cr5, cr4 and cr3 are reserved for future use.
17/61 m58lw064c table 3. configuration register note: 1. 4 - 2 - 2 - 2 (represents x-y-y-y) is not allowed. 2. x latencies can be calculated as: (t avqv ? t llkh + t qvkh ) + t system margin < (x -1) t k. (x is an integer number from 4 to 8 and t k is the clock period). 3. y latencies can be calculated as: t khqv + t system margin + t qvkh < y t k. 4. t system margin is the time margin required for the calculation. address bit mnemonic bit name reset value value description 16 cr15 read select 1 0 synchronous burst read 1 asynchronous read (default at power-up) 15 cr14 reserved 14 to 12 cr13-cr11 x-latency (2) xxx 001 reserved 010 x-latency = 4, 4-1-1-1 (use only with y-latency = 1) (1) 011 x-latency = 5, 5-1-1-1, 5-2-2-2 100 x-latency = 6, 6-1-1-1, 6-2-2-2 101 x-latency = 7, 7-1-1-1, 7-2-2-2 110 x-latency = 8, 8-1-1-1, 8-2-2-2 11 cr10 internal clock divider x 0 x and y-latencies remains as set in cr13-cr11 and cr9 1 divides internal clock, x and y-latencies multiplied by 2 10 cr9 y-latency (3) x 0y-latency = 1 1y-latency = 2 9 cr8cr8 valid data ready x 0 r valid low during valid clock edge 1 r valid low one cycle before valid clock edge 8cr7burst typex 0 interleaved 1 sequential 7cr6 valid clock edge x 0 falling clock edge 1 rising clock edge 6 to 4 cr5-cr3 reserved 3 to 1 cr2-cr0 burst length xxx 001 4 words 010 8 words 111 continuous
m58lw064c 18/61 table 4. burst type definition figure 6. burst configuration x-1-1-1 starting address x4 sequential x4 interleaved x8 sequential x8 interleaved continuous 0 0-1-2-3 0-1-2-3 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7 0-1-2-3-4-5-6-7-8-9-10.. 1 1-2-3-0 1-0-3-2 1-2-3-4-5-6-7-0 1-0-3-2-5-4-7-6 1-2-3-4-5-6-7-8-9-10-11.. 2 2-3-0-1 2-3-0-1 2-3-4-5-6-7-0-1 2-3-0-1-6-7-4-5 2-3-4-5-6-7-8-9-10-11-12.. 3 3-0-1-2 3-2-1-0 3-4-5-6-7-0-1-2 3-2-1-0-7-6-5-4 3-4-5-6-7-8-9-10-11-12-13.. 4 ? ? 4-5-6-7-0-1-2-3 4-5-6-7-0-1-2-3 4-5-6-7-8-9-10-11-2-13-14.. 5 ? ? 5-6-7-0-1-2-3-4 5-4-7-6-1-0-3-2 5-6-7-8-9-10-11-12-13-14.. 6 ? ? 6-7-0-1-2-3-4-5 6-7-4-5-2-3-0-1 6-7-8-9-10-11-12-13-14-15.. 7 ? ? 7-0-1-2-3-4-5-6 7-6-5-4-3-2-1-0 7-8-9-10-11-12-13-14-15-16.. 8 ? ? ? ? 8-9-10-11-12-13-14-15-16-17.. ai05512 k dq l add valid dq dq dq dq 4-1-1-1 5-1-1-1 6-1-1-1 7-1-1-1 8-1-1-1 0123456789 valid valid valid valid valid valid valid valid valid valid valid valid valid valid valid valid valid valid valid valid
19/61 m58lw064c figure 7. burst configuration x-2-2-2 ai05513 k l add dq valid dq dq dq 5-2-2-2 6-2-2-2 7-2-2-2 8-2-2-2 0123456789 valid valid valid valid valid valid valid valid nv nv nv nv nv nv nv nv nv nv nv=not valid
m58lw064c 20/61 command interface all bus write operations to the memory are inter- preted by the command interface. commands consist of one or more sequential bus write oper- ations. the commands are summarized in table 5., commands . refer to table 5 in conjunction with the text descriptions below. after power-up or a reset operation the memory enters read mode. synchronous read operations and latch con- trolled read operations can only be used to read the memory array. the electronic signature, cfi or status register will be read in asynchronous mode or single synchronous burst mode. once the memory returns to read memory array mode the bus will resume the setting in the configuration register automatically. read memory array command. the read mem- ory array command returns the memory to read mode. one bus write cycle is required to issue the read memory array command and return the memory to read mode. once the command is is- sued the memory remains in read mode until an- other command is issued. in read mode bus read operations access the memory array. while the program/erase controller is executing a program, erase, block protect, blocks unprotect or protection register program operation the memory will not accept the read memory array command until the operation completes. read electronic signature command. the read electronic signature command is used to read the manufacturer code, the device code, the block protection status, the configuration register and the protection register. one bus write cycle is re- quired to issue the read electronic signature command. once the command is issued subse- quent bus read operations read the manufacturer code, the device code, the block protection sta- tus, the configuration register or the protection register until another command is issued. refer to table 7., read electronic signature , table 3., configuration register and figure 8., protection register memory map for informa- tion on the addresses. read query command. the read query com- mand is used to read data from the common flash interface (cfi) memory area. one bus write cycle is required to issue the read query command. once the command is issued subsequent bus read operations read from the common flash in- terface memory area. see appendix b , tables 26 , 27 , 28 , 29 , 30 and 31 for details on the information contained in the common flash interface (cfi) memory area. read status register command. the read sta- tus register command is used to read the status register. one bus write cycle is required to issue the read status register command. once the command is issued subsequent bus read opera- tions read the status register until another com- mand is issued. the status register information is present on the output data bus (dq1-dq7) when both chip en- able and output enable are low, v il . see the section on the status register and table 10 for details on the definitions of the status reg- ister bits clear status register command. the clear sta- tus register command can be used to reset bits 1, 3, 4 and 5 in the status register to ?0?. one bus write is required to issue the clear status register command. the bits in the status register are sticky and do not automatically return to ?0? when a new write to buffer and program, erase, block protect, block unprotect or protection register program com- mand is issued. if any error occurs then it is essen- tial to clear any error bits in the status register by issuing the clear status register command before attempting a new program, erase or resume command. block erase command. the block erase com- mand can be used to erase a block. it sets all of the bits in the block to ?1?. all previous data in the block is lost. if the block is protected then the erase operation will abort, the data in the block will not be changed and the status register will output the error. two bus write operations are required to issue the command; the second bus write cycle latches the block address in the internal state machine and starts the program/erase controller. once the command is issued subsequent bus read opera- tions read the status register. see the section on the status register for details on the definitions of the status register bits. during the erase operation the memory will only accept the read status register command and the program/erase suspend command. all other commands will be ignored. typical erase times are given in table 9 . see appendix c , figure 25., erase flowchart and pseudo code , for a suggested flowchart on using the block erase command. word program command. the word program command is used to program a single word in the memory array. two bus write operations are re- quired to issue the command; the first write cycle sets up the word program command, the second write cycle latches the address and data to be pro-
21/61 m58lw064c grammed in the internal state machine and starts the program/erase controller. if the block being programmed is protected an er- ror will be set in the status register and the oper- ation will abort without affecting the data in the memory array. the block must be unprotected us- ing the blocks unprotect command. write to buffer and program command. the write to buffer and program command is used to program the memory array. up to 16 words can be loaded into the write buffer and programmed into the memory. each write buffer has the same a5-a22 addresses. four successive steps are required to issue the command. 1. one bus write operation is required to set up the write to buffer and program command. issue the set up command with the selected memory block address where the program operation should occur (any address in the block where the values will be programmed can be used). any bus read operations will start to output the status register after the 1st cycle. 2. use one bus write operation to write the same block address along with the value n on the data inputs/output, where n+1 is the number of words to be programmed. 3. use n+1 bus write operations to load the address and data for each word into the write buffer. see the constraints on the address combinations listed below. the addresses must have the same a5-a22. 4. finally, use one bus write operation to issue the final cycle to confirm the command and start the program operation. invalid address combinations or failing to follow the correct sequence of bus write cycles will set an error in the status register and abort the oper- ation without affecting the data in the memory ar- ray. the status register should be cleared before re-issuing the command. if the block being programmed is protected an er- ror will be set in the status register and the oper- ation will abort without affecting the data in the memory array. the block must be unprotected us- ing the blocks unprotect command. see appendix c , figure 23., write to buffer and program flowchart and pseudo code , for a sug- gested flowchart on using the write to buffer and program command. program/erase suspend command. the pro- gram/erase suspend command is used to pause a word program, write to buffer and program or erase operation. the command will only be ac- cepted during a program or an erase operation. it can be issued at any time during an erase opera- tion but will only be accepted during a word pro- gram or write to buffer and program command if the program/erase controller is running. one bus write cycle is required to issue the pro- gram/erase suspend command and pause the program/erase controller. once the command is issued it is necessary to poll the program/erase controller status bit (sr7) to find out when the program/erase controller has paused; no other commands will be accepted until the program/ erase controller has paused. after the program/ erase controller has paused, the memory will con- tinue to output the status register until another command is issued. during the polling period between issuing the pro- gram/erase suspend command and the program/ erase controller pausing it is possible for the op- eration to complete. once the program/erase controller status bit (sr7) indicates that the pro- gram/erase controller is no longer active, the pro- gram suspend status bit (sr2) or the erase suspend status bit (sr6) can be used to deter- mine if the operation has completed or is suspend- ed. for timing on the delay between issuing the program/erase suspend command and the pro- gram/erase controller pausing see table 9 . during program/erase suspend the read memo- ry array, read status register, read electronic signature, read query and program/erase re- sume commands will be accepted by the com- mand interface. additionally, if the suspended operation was erase then the write to buffer and program, and the program suspend commands will also be accepted. when a program operation is completed inside a block erase suspend the read memory array command must be issued to reset the device in read mode, then the erase re- sume command can be issued to complete the whole sequence. only the blocks not being erased may be read or programmed correctly. see appendix c , figure 24., program suspend & resume flowchart and pseudo code , and figure 26., erase suspend & resume flowchart and pseudo code , for suggested flowcharts on using the program/erase suspend command. program/erase resume command. the pro- gram/erase resume command can be used to re- start the program/erase controller after a program/erase suspend operation has paused it. one bus write cycle is required to issue the pro- gram/erase resume command. once the com- mand is issued subsequent bus read operations read the status register. set configuration register command. the set configuration register command is used to write a new value to the configuration register which defines the burst length, type, x and y laten-
m58lw064c 22/61 cies, synchronous/asynchronous read mode and the valid clock edge configuration. two bus write cycles are required to issue the set configuration register command. once the com- mand is issued the memory returns to read mode as if a read memory array command had been is- sued. the value for the configuration register is pre- sented on a1-a16. cr0 is on a1, cr1 on a2, etc.; the other address bits are ignored. block protect command. the block protect command is used to protect a block and prevent program or erase operations from changing the data in it. two bus write cycles are required to is- sue the block protect command; the second bus write cycle latches the block address in the inter- nal state machine and starts the program/erase controller. once the command is issued subse- quent bus read operations read the status reg- ister. see the section on the status register for details on the definitions of the status register bits. during the block protect operation the memory will only accept the read status register command. all other commands will be ignored. typical block protection times are given in table 9 . the block protection bits are non-volatile, once set they remain set through reset and power- down/power-up. they are cleared by a blocks un- protect command. see appendix c , figure 27., block protect flow- chart and pseudo code , for a suggested flowchart on using the block protect command. blocks unprotect command. the blocks un- protect command is used to unprotect all of the blocks. two bus write cycles are required to issue the blocks unprotect command; the second bus write cycle starts the program/erase controller. once the command is issued subsequent bus read operations read the status register. see the section on the status register for details on the definitions of the status register bits. during the block unprotect operation the memory will only accept the read status register com- mand. all other commands will be ignored. typical block protection times are given in table 9 . see appendix c , figure 28., block unprotect flowchart and pseudo code , for a suggested flow- chart on using the block unprotect command. protection register program command. the protection register program command is used to program the 64 bit user segment of the protection register. the segment is programmed 16 bits at a time. two write cycles are required to issue the protection register program command. the first bus cycle sets up the protection register program command. the second latches the address and the data to be written to the protection register and starts the program/erase controller. read operations output the status register con- tent after the programming has started. the user-programmable segment can be locked by programming bit 1 of the protection register lock location to ?0? (see table 8 ). bit 0 of the pro- tection register lock location locks the factory programmed segment and is programmed to ?0? in the factory. the locking of the protection register is not reversible, once the lock bits are pro- grammed no further changes can be made to the values stored in the protection register, see fig- ure 8., protection register memory map . attempt- ing to program a previously protected protection register will result in a status register error. the protection register program cannot be sus- pended. see appendix c , figure 29., protection register program flowchart and pseudo code , for the flowchart for using the protection register program command. configure sts command. the configure sts command is used to configure the status/(ready/busy) pin. after power-up or re- set the sts pin is configured in ready/busy mode. the pin can be configured in status mode using the configure sts command (refer to sta- tus/(ready/busy) section for more details. two write cycles are required to issue the config- ure sts command. the first bus cycle sets up the configure sts command. the second specifies one of the four possible configurations (refer to table 6., configuration codes ): ? ready/busy mode ? pulse on erase complete mode ? pulse on program complete mode ? pulse on erase or program complete mode the device will not accept the configure sts com- mand while the program/erase controller is busy or during program/erase suspend. when sts pin is pulsing it remains low for a typical time of 250ns. any invalid configuration code will set an error in the status register.
23/61 m58lw064c table 5. commands note: 1. x don?t care; ra read address, rd read data, ida identifi er address, idd identifier data, srd status register data, pa p rogram address; pd program data, qa query address, qd query data, ba any address in the block, cr configuration register value, cc configuration code. 2. base address, refer to figure 8 and table 8 for more information. 3. for identifier addresses and data refer to table 7., read electronic signature . 4. for query address and data refer to appendix b., common flash interface - cfi . table 6. configuration codes note: 1. dq2-dq7 are reserved 2. when sts pin is pulsing it remains low for a typical time of 250ns. command cycles bus operations 1st cycle 2nd cycle subsequent final op. addr. data op. addr. data op. addr. data op. addr. data read memory array 2 write x ffh read ra rd read electronic signature 2 write x 90h read ida (3) idd (3) read status register 2 write x 70h read x srd read query 2 write x 98h read qa (4) qd (4) clear status register 1 write x 50h block erase 2 write x 20h write ba d0 word program 2 write x 40h 10h write pa pd write to buffer and program 4 + n write ba e8h write ba n write pa pd write x d0h program/erase suspend 1 write x b0h program/erase resume 1 write x d0h set configuration register 2 write x 60h write cr 03h block protect 2 write x 60h write ba 01h blocks unprotect 2 write x 60h write x d0h protection register program 2writex c0hwrite pra prd configure sts command 2 write x b8h write x cc configuration code dq1 dq2 mode sts pin description 00h 0 0 ready/busy v ol during p/e operations hi-z when the memory is ready the sts pin is low during program and erase operations and high impedance when the memory is ready for any read, program or erase operation. 01h 0 1 pulse on erase complete pulse low then high when operation completed (2) supplies a system interrupt pulse at the end of a block erase operation. 02h 1 0 pulse on program complete supplies a system interrupt pulse at the end of a program operation. 03h 1 1 pulse on erase or program complete supplies a system interrupt pulse at the end of a block erase or program operation.
m58lw064c 24/61 table 7. read electronic signature note: 1. sba is the start base address of each block, cr is configuration register data, prd is protection register data. 2. base address, refer to figure 8 and table 8 for more information. table 8. read protection register figure 8. protection register memory map code address (a22-a1) data (dq15-dq0) manufacturer code 000000h 0020h device code 000001h 8820h block protection status sba+02h 0000h (block unprotected) 0001h (block protected) configuration register 000005h cr protection register 000080h (2) prd word use a8a7a6a5a4a3a2a1 lockfactory, user 10000000 0factory (unique id)10000001 1factory (unique id)10000010 2factory (unique id)10000011 3factory (unique id)10000100 4 user 10000101 5 user 10000110 6 user 10000111 7 user 10001000 ai05501 user programmable unique device number protection register lock 1 0 88h 85h 84h 81h 80h word address
25/61 m58lw064c table 9. program, erase times and program erase endurance cycles note: 1. typical values measured at room temperature and nominal voltages. 2. sampled, but not 100% tested. 3. effective byte programming time 6s, effective word programming time 12s. 4. maximum value measured at worst case conditions for both temperature and v dd after 100,000 program/erase cycles. 5. maximum value measured at worst case conditions for both temperature and v dd . parameters m58lw064c unit min typ (1,2) max (2) block (1mb) erase 1.2 4.8 (4) s chip program (write to buffer) 49 145 (4) s chip erase time 74 220 (4) s program write buffer 192 (3) 576 (4) s word/byte program time (word/byte program command) 16 48 (4) s program suspend latency time 1 20 (5) s erase suspend latency time 1 25 (5) s block protect time 18 30 (5) s blocks unprotect time 0.75 1.2 (5) s program/erase cycles (per block) 100,000 cycles data retention 20 years
m58lw064c 26/61 status register the status register provides information on the current or previous program, erase, block protect or blocks unprotect operation. the various bits in the status register convey information and errors on the operation. they are output on dq7-dq0. to read the status register the read status reg- ister command can be issued. the status register is automatically read after program, erase, block protect, blocks unprotect and program/erase re- sume commands. the status register can be read from any address. the status register can only be read using asyn- chronous bus read or single synchronous read operations. once the memory returns to read memory array mode the bus will resume the set- ting in the configuration register automatically. the contents of the status register can be updat- ed during an erase or program operation by tog- gling the output enable pin or by dis-activating (chip enable, v ih ) and then reactivating (chip en- able and output enable, v il ) the device. status register bits sr5, sr4, sr3 and sr1 are associated with various error conditions and can only be reset with the clear status register com- mand. the status register bits are summarized in table 10., status register bits . refer to table 10 in conjunction with the following text descriptions. program/erase controller status bit (sr7). the program/erase controller status bit indicates whether the program/erase controller is active or inactive. when the program/erase controller sta- tus bit is low, v ol , the program/erase controller is active and all other status register bits are high impedance; when the bit is high, v oh , the pro- gram/erase controller is inactive. the program/erase controller status is low im- mediately after a program/erase suspend com- mand is issued until the program/erase controller pauses. after the program/erase controller paus- es the bit is high. during program, erase, block protect and blocks unprotect operations the program/erase control- ler status bit can be polled to find the end of the operation. the other bits in the status register should not be tested until the program/erase con- troller completes the operation and the bit is high. after the program/erase controller completes its operation the erase status, program status and block protection status bits should be tested for errors. erase suspend status bit (sr6). the erase suspend status bit indicates that an erase opera- tion has been suspended and is waiting to be re- sumed. the erase suspend status should only be considered valid when the program/erase con- troller status bit is high (program/erase controller inactive); after a program/erase suspend com- mand is issued the memory may still complete the operation rather than entering the suspend mode. when the erase suspend status bit is low, v ol , the program/erase controller is active or has com- pleted its operation. when the bit is high, v oh , a program/erase suspend command has been is- sued and the memory is waiting for a program/ erase resume command. when a program/erase resume command is is- sued the erase suspend status bit returns low. erase status bit (sr5). the erase status bit can be used to identify if the memory has failed to verify that the block has erased correctly or that all blocks have been unprotected successfully. the erase status bit should be read once the program/ erase controller status bit is high (program/erase controller inactive). when the erase status bit is low, v ol , the mem- ory has successfully verified that the block has erased correctly or all blocks have been unprotect- ed successfully. when the erase status bit is high, v oh , the erase operation has failed. de- pending on the cause of the failure other status register bits may also be set to high, v oh . if only the erase status bit (sr5) is set high, v oh , then the program/erase controller has applied the maximum number of pulses to the block and still failed to verify that the block has erased correctly or that all the blocks have been unprotected successfully. if the failure is due to an erase or blocks unprotect with v pen low, v ol , then v pen status bit (sr3) is also set high, v oh . if the failure is due to an erase on a protected block then block protection status bit (sr1) is also set high, v oh . if the failure is due to a program or erase incorrect command sequence then program status bit (sr4) is also set high, v oh . once set high, the erase status bit can only be re- set low by a clear status register command or a hardware reset. if set high it should be reset be- fore a new program or erase command is issued, otherwise the new command will appear to fail. program status bit (sr4). the program status bit is used to identify a program or block protect failure. the program status bit should be read once the program/erase controller status bit is high (program/erase controller inactive). when the program status bit is low, v ol , the memory has successfully verified that the write buffer has programmed correctly or the block is protected. when the program status bit is high,
27/61 m58lw064c v oh , the program or block protect operation has failed. depending on the cause of the failure other status register bits may also be set to high, v oh . if only the program status bit (sr4) is set high, v oh , then the program/erase controller has applied the maximum number of pulses to the byte and still failed to verify that the write buffer has programmed correctly or that the block is protected. if the failure is due to a program or block protect with v pen low, v ol , then v pen status bit (sr3) is also set high, v oh . if the failure is due to a program on a protected block then block protection status bit (sr1) is also set high, v oh . if the failure is due to a program or erase incorrect command sequence then erase status bit (sr5) is also set high, v oh . once set high, the program status bit can only be reset low by a clear status register command or a hardware reset. if set high it should be reset be- fore a new program or erase command is issued, otherwise the new command will appear to fail. v pen status bit (sr3). the v pen status bit can be used to identify if a program, erase, block pro- tection or block unprotection operation has been attempted when v pen is low, v il . when the v pen status bit is low, v ol , no pro- gram, erase, block protection or block unprotec- tion operations have been attempted with v pen low, v il , since the last clear status register com- mand, or hardware reset. when the v pen status bit is high, v oh , a program, erase, block protec- tion or block unprotection operation has been at- tempted with v pen low, v il . once set high, the v pen status bit can only be re- set by a clear status register command or a hard- ware reset. if set high it should be reset before a new program, erase, block protection or block unprotection command is issued, otherwise the new command will appear to fail. program suspend status bit (sr2). the pro- gram suspend status bit indicates that a program operation has been suspended and is waiting to be resumed. the program suspend status should only be considered valid when the program/erase controller status bit is high (program/erase con- troller inactive); after a program/erase suspend command is issued the memory may still complete the operation rather than entering the suspend mode. when the program suspend status bit is low, v ol , the program/erase controller is active or has completed its operation; when the bit is high, v oh , a program/erase suspend command has been is- sued and the memory is waiting for a program/ erase resume command. when a program/erase resume command is is- sued the program suspend status bit returns low. block protection status bit (sr1). the block protection status bit can be used to identify if a program or erase operation has tried to modify the contents of a protected block. when the block protection status bit is low, v ol , no program or erase operations have been at- tempted to protected blocks since the last clear status register command or hardware reset. when the block protection status bit is high, v oh , a program (sr4 set high) or erase (sr5 set high) operation has been attempted on a protected block. once set high, the block protection status bit can only be reset low by a clear status register com- mand or a hardware reset. if set high it should be reset before a new program or erase command is issued, otherwise the new command will appear to fail. reserved (sr0). sr0 of the status register is reserved. its value should be masked.
m58lw064c 28/61 table 10. status register bits operation sr7 sr 6 sr5 sr4 sr3 sr2 sr1 rb result (hex) program/erase controller active 0 hi-z v ol n/a write buffer not ready 0 hi-z v ol n/a write buffer ready 1000000hi-z80h write buffer ready in erase suspend 1 1 0 0 0 0 0 hi-z c0h program suspended 1 0 0 0 0 1 0 hi-z 84h program suspended in erase suspend 1 1 0 0 0 1 0 hi-z c4h program/block protect completed successfully 1000000hi-z80h program completed successfully in erase suspend 1100000hi-zc0h program/block protect failure due to incorrect command sequence 1011000hi-zb0h program failure due to incorrect command sequence in erase suspend 1111000hi-zf0h program/block protect failure due to v pen error 1001100hi-z98h program failure due to v pen error in erase suspend 1101100hi-zd8h program failure due to block protection 1 0 0 1 0 0 1 hi-z 92h program failure due to block protection in erase suspend 1101001hi-zd2h program/block protect failure due to cell failure 1001000hi-z90h program failure due to cell failure in erase suspend 1101000hi-zd0h erase suspended 1 1 0 0 0 0 0 hi-z c0h erase/blocks unprotect completed successfully 1000000hi-z80h erase/blocks unprotect failure due to incorrect command sequence 1011000hi-zb0h erase/blocks unprotect failure due to v pen error 1010100hi-za8h erase failure due to block protection 1 0 1 0 0 0 1 hi-z a2h erase/blocks unprotect failure due to failed cells in block 1010000hi-za0h
29/61 m58lw064c maximum rating stressing the device above the ratings listed in ta- ble 11., absolute maximum ratings , may cause permanent damage to the device. these are stress ratings only and operation of the device at these or any other conditions above those indicat- ed in the operating sections of this specification is not implied. exposure to absolute maximum rat- ing conditions for extended periods may affect de- vice reliability. refer also to the stmicroelectronics sure program and other rel- evant quality documents. table 11. absolute maximum ratings note: 1. compliant with the jedec std j-std-020b (for small body, sn-pb or pb assermbly), the st ecopack ? 7191395 specification, and the european directive on restrictions on hazardous substances (rohs) 2002/95/eu. symbol parameter value unit min max t bias temperature under bias ?40 125 c t stg storage temperature ?55 150 c t lead lead temperature during soldering (1) c v io input or output voltage ?0.6 v ddq +0.6 v v dd , v ddq supply voltage ?0.6 5.0 v
m58lw064c 30/61 dc and ac parameters this section summarizes the operating and mea- surement conditions, and the dc and ac charac- teristics of the device. the parameters in the dc and ac characteristics tables that follow, are de- rived from tests performed under the measure- ment conditions summarized in table 12., operating and ac measurement conditions . designers should check that the operating condi- tions in their circuit match the measurement condi- tions when relying on the quoted parameters. table 12. operating and ac measurement conditions figure 9. ac measurement input output waveform figure 10. ac measurement load circuit table 13. capacitance note: 1. t a = 25c, f = 1 mhz 2. sampled only, not 100% tested. parameter m58lw064c units 110 min max supply voltage (v dd ) 2.7 3.6 v input/output supply voltage (v ddq ) 1.8 v dd v ambient temperature (t a ) grade 1 0 70 c grade 6 ?40 85 c load capacitance (c l ) 30 pf clock rise and fall times 3 ns input rise and fall times 4 ns input pulses voltages 0 to v ddq v input and output timing ref. voltages 0.5 v ddq v ai00610 v ddq 0v 0.5 v ddq ai03459 1.3v dq s c l c l includes jig capacitance 3.3k ? 1n914 device under test 0.1f v dd v ddq 0.1f symbol parameter test condition typ max unit c in input capacitance v in = 0v 68pf c out output capacitance v out = 0v 812pf
31/61 m58lw064c table 14. dc characteristics figure 11. asynchronous random read ac waveforms note: asynchronous read cr15 = 1 symbol parameter test condition min max unit i li input leakage current 0v v in v ddq 1 a i lo output leakage current 0v v out v ddq 5 a i dd supply current (random read) e = v il , g = v ih , f add = 6mhz 20 ma i ddb supply current (burst read) e = v il , g = v ih , f clock = 50mhz 30 ma i dd1 supply current (standby) e = v ih , rp = v ih 40 a i dd2 supply current (reset/power-down) rp = v il 40 a i dd3 supply current (program or erase, block protect, block unprotect) program or erase operation in progress 30 ma i dd4 supply current (erase/program suspend) e = v ih 40 a i dd5 supply current (auto low-power) e = v il , rp = v ih 40 a v il input low voltage ?0.5 v ddq x 0.3 v v ih input high voltage v ddq x 0.7 v ddq + 0.5 v v ol output low voltage i ol = 100a 0.2 v v oh output high voltage i oh = ?100a v ddq ?0.2 v v lko v dd supply voltage (erase and program lockout) 2v ai06224 e g a1-a22 dq0-dq15 valid taxqx telqx tavqv tglqv tehqz tghqx output tavav tehqx tghqz tglqx telqv l
m58lw064c 32/61 table 15. asynchronous random read ac characteristics. figure 12. asynchronous latch controlled read ac waveforms note: asynchronous read cr15 = 1 symbol parameter m58lw064c unit 110 t avav address valid to address valid min 110 ns t avqv address valid to output valid max 110 ns t elqx chip enable low to output transition min 0 ns t elqv chip enable low to output valid max 110 ns t glqx output enable low to output transition min 0 ns t glqv output enable low to output valid max 25 ns t ehqx chip enable high to output transition min 0 ns t ghqx output enable high to output transition min 0 ns t axqx address transition to output transition min 0 ns t ehqz chip enable high to output hi-z max 25 ns t ghqz output enable high to output hi-z max 20 ns ai06225 l e g a1-a22 dq0-dq15 valid tehlx tlhll tlhax tavll telll tlllh tehqx tghqz tllqv tglqv output tavlh tellh tghqx tllqx tehqz tglqx
33/61 m58lw064c table 16. asynchronous latch controlled read ac characteristics note: for other timings see table 15., asynchronous random read ac characteristics. . figure 13. asynchronous page read ac waveforms note: asynchronous read cr15 = 1 symbol parameter m58lw064c unit 110 t avll address valid to latch enable low min 0 ns t avlh address valid to latch enable high min 10 ns t lhll latch enable high to latch enable low min 10 ns t lllh latch enable low to latch enable high min 10 ns t elll chip enable low to latch enable low min 0 ns t ellh chip enable low to latch enable high min 10 ns t llqx latch enable low to output transition min 0 ns t llqv latch enable low to output valid min 110 ns t lhax latch enable high to address transition min 6 ns t glqx output enable low to output transition min 0 ns t glqv output enable low to output valid max 25 ns t ehlx chip enable high to latch enable transition min 0 ns ai06226 e g a3-a22 dq0-dq15 valid taxqx telqx tavqv tglqv tehqx tghqz output output a1-a2 taxqx1 valid valid tghqx tehqz telqv tglqx tavqv1 l
m58lw064c 34/61 table 17. asynchronous page read ac characteristics note: for other timings see table 15., asynchronous random read ac characteristics. . figure 14. asynchronous write ac waveform, write enable controlled symbol parameter m58lw064c unit 110 t axqx1 address transition to output transition min 6 ns t avqv1 address valid to output valid max 25 ns ai06227 dq0-dq15 rb w a1-a22 e g input valid twheh tavwh twlwh telwl v pp twhax twhwl twhdx tdvwh tvphwh twhgl tghwl twhbl l
35/61 m58lw064c figure 15. asynchronous latch controlled write ac waveform, write enable controlled ai06228 dq0-dq15 rb w a1-a22 e g input valid twheh tavlh twlwh telll v pp tlhax twhwl twhdx tdvwh tvphwh twhgl tghwl twhbl tlllh telwl l tlhgl tlhwh twllh
m58lw064c 36/61 table 18. asynchronous write and latch controlled write ac characteristics, w controlled. symbol parameter m58lw064c unit 110 t avlh address valid to latch enable high min 10 ns t avwh address valid to write enable high min 50 ns t dvwh data input valid to write enable high min 50 ns t elwl chip enable low to write enable low min 0 ns t elll chip enable low to latch enable low min 0 ns t lhax latch enable high to address transition min 6 ns t lhgl latch enable high to output enable low min 95 ns t lhwh latch enable high to write enable high min 0 ns t lllh latch enable low to latch enable high min 10 ns t llwh latch enable low to write enable high min 50 ns t vphwh program/erase enable high to write enable high min 0 ns t whax write enable high to address transition min 0 ns t whbl write enable high to ready/busy low max 500 ns t whdx write enable high to input transition min 0 ns t wheh write enable high to chip enable high min 0 ns t ghwl output enable high to write enable low min 20 ns t whgl write enable high to output enable low min 35 ns t whwl write enable high to write enable low min 30 ns t wlwh write enable low to write enable high min 70 ns t wllh write enable low to latch enable high min 10 ns
37/61 m58lw064c figure 16. asynchronous write ac waveforms, chip enable controlled figure 17. asynchronous latch controlled write ac waveforms, chip enable controlled ai06229 dq0-dq15 rb e a1-a22 w g input valid tehwh taveh teleh twlel v pp tehax tehel tehdx tdveh tvpheh tehgl tghel tehbl l ai06230 dq0-dq15 rb e a1-a22 w g input valid tehwh tavlh teleh twlll v pp tlhax tehel tehdx tdveh tvpheh tehgl tghel tehbl tlllh twlel l tehax taveh tlhgl tlheh tellh
m58lw064c 38/61 table 19. asynchronous write and latch controlled write ac characteristics, e controlled symbol parameter m58lw064c unit 110 t avlh address valid to latch enable high min 10 ns t aveh address valid to chip enable high min 50 ns t dveh data input valid to chip enable high min 50 ns t wlel write enable low to chip enable low min 0 ns t wlll write enable low to latch enable low min 0 ns t lhax latch enable high to address transition min 6 ns t lhgl latch enable high to output enable low min 35 ns t lheh latch enable high to chip enable high min 0 ns t lllh latch enable low to latch enable high min 10 ns t lleh latch enable low to chip enable high min 50 ns t vpheh program/erase enable high to chip enable high min 0 ns t ehax chip enable high to address transition min 0 ns t ehbl chip enable high to ready/busy low max 500 ns t ehdx chip enable high to input transition min 0 ns t ehwh chip enable high to write enable high min 0 ns t ghel output enable high to chip enable low min 20 ns t ehgl chip enable high to output enable low min 35 ns t ehel chip enable high to chip enable low min 30 ns t eleh chip enable low to chip enable high min 70 ns t ellh chip enable low to latch enable high min 10 ns
39/61 m58lw064c figure 18. synchronous burst read ac waveform note: valid clock edge = rising (cr6 = 1) ai06231 dq0-dq15 a1-a22 l e g k valid tkhax tqvkh x+2y x+y x x-1 2 1 0 tkhll tllkh telkh tavkh tehqz tghqz tglkh q1 q2 q3 tkhqx x+2y+1 x+2y+2 tkhqv tlllh tlhax tavlh tellh tghqx tehqx
m58lw064c 40/61 figure 19. synchronous burst read, continuous, valid data ready output note: 1. valid data ready = valid low during valid clock edge (cr8 = 0) 2. v= valid output, nv= not valid output. 3. r is an open drain output with an internal pull up resistor of 1m ?. depending on the valid data ready pin capacitance load an external pull up resistor must be chosen according to the system clock period. table 20. synchronous burst read ac characteristics note: for other timings see table 15., asynchronous random read ac characteristics. . symbol parameter m58lw064c unit 110 t avkh address valid to active clock edge min 7 ns t avlh address valid to latch enable high min 10 ns t elkh chip enable low to active clock edge min 10 ns t ellh chip enable low to latch enable high min 10 ns t glkh output enable low to valid clock edge min 20 ns t khax valid clock edge to address transition min 5 ns t khll valid clock edge to latch enable low min 0 ns t khlh valid clock edge to latch enable high min 0 ns t khqx valid clock edge to output transition min 3 ns t llkh latch enable low to valid clock edge min 7 ns t lllh latch enable low to latch enable high min 6 ns t khqv valid clock edge to output valid max 15 ns t qvkh output valid to active clock edge min 5 ns t rlkh valid data ready low to valid clock edge min 5 ns ai05510 k output (2) v v nv nv v v trlkh r v (3)
41/61 m58lw064c figure 20. reset, power-down and power-up ac waveform table 21. reset, power-down and power-up ac characteristics symbol parameter m58lw064c unit 110 t phqv reset/power-down high to data valid max 150 ns t plph reset/power-down low to reset/power-down high min 100 ns t plrh reset/power-down low to ready high max 30 s t vdhph supply voltages high to reset/power-down high min 0 s ai05521 rb w rp e, g vdd, vddq tvdhph tplph tplrh power-up and reset reset during program or erase dq0-dq15 tphqv
m58lw064c 42/61 package mechanical figure 21. tsop56 - 56 lead plastic thin small outline, 14 x 20 mm, package outline note: drawing is not to scale. table 22. tsop56 - 56 lead plastic thin small outline, 14 x 20 mm, package mechanical data symbol millimeters inches typ min max typ min max a 1.200 0.0472 a1 0.100 0.050 0.150 0.0039 0.0020 0.0059 a2 1.000 0.950 1.050 0.0394 0.0374 0.0413 b 0.220 0.170 0.270 0.0087 0.0067 0.0106 c 0.100 0.210 0.0039 0.0083 cp 0.100 0.0039 d 20.000 19.800 20.200 0.7874 0.7795 0.7953 d1 18.400 18.300 18.500 0.7244 0.7205 0.7283 e 0.500 ? ? 0.0197 ? ? e 14.000 13.900 14.100 0.5512 0.5472 0.5551 l 0.600 0.500 0.700 0.0236 0.0197 0.0276 305305 n56 56 tsop-b d1 e 1 n cp b e a2 a n/2 d die c l a1
43/61 m58lw064c figure 22. tbga64 10x13mm - 8x8 ball array, 1mm pitch, package outline note: drawing is not to scale. table 23. tbga64 10x13mm - 8x8 ball array, 1mm pitch, package mechanical data symbol millimeters inches typ min max typ min max a 1.200 0.0472 a1 0.300 0.200 0.350 0.0118 0.0079 0.0138 a2 0.850 0.0335 b 0.400 0.500 0.0157 0.0197 d 10.000 9.900 10.100 0.3937 0.3898 0.3976 d1 7.000 ? ? 0.2756 ? ? ddd 0.100 0.0039 e 1.000 ? ? 0.0394 ? ? e 13.000 12.900 13.100 0.5118 0.5079 0.5157 e1 7.000 ? ? 0.2756 ? ? fd 1.500 ? ? 0.0591 ? ? fe 3.000 ? ? 0.1181 ? ? sd 0.500 ? ? 0.0197 ? ? se 0.500 ? ? 0.0197 ? ? e1 e d1 d eb sd se a2 a1 a bga-z23 ddd fd fe ball "a1"
m58lw064c 44/61 part numbering table 24. ordering information scheme note: devices are shipped from the factory with the memory content bits erased to ?1?. for a list of available options (speed, package, etc...) or for further information on any aspect of this de- vice, please contact the st sales office nearest to you. example: m58lw064c 110 n 1 t device type m58 architecture l = page mode, burst operating voltage w = v dd = 2.7v to 3.6v; v ddq = 1.8 to v dd device function 064c = 64 mbit (x16), uniform block speed 110 = 110 ns package n = tsop56: 14 x 20 mm za = tbga64: 10 x 13mm, 1mm pitch temperature range 1 = 0 to 70 c 6 = ?40 to 85 c option t = tape & reel packing e = lead-free package, standard packing f = lead-free package, tape & reel packing
45/61 m58lw064c appendix a. block address table table 25. block addresses block number address range (x16 bus width) 64 3f0000h-3fffffh 63 3e0000h-3effffh 62 3d0000h-3dffffh 61 3c0000h-3cffffh 60 3b0000h-3bffffh 59 3a0000h-3affffh 58 390000h-39ffffh 57 380000h-38ffffh 56 370000h-37ffffh 55 360000h-36ffffh 54 350000h-35ffffh 53 340000h-34ffffh 52 330000h-33ffffh 51 320000h-32ffffh 50 310000h-31ffffh 49 300000h-30ffffh 48 2f0000h-2fffffh 47 2e0000h-2effffh 46 2d0000h-2dffffh 45 2c0000h-2cffffh 44 2b0000h-2bffffh 43 2a0000h-2affffh 42 290000h-29ffffh 41 280000h-28ffffh 40 270000h-27ffffh 39 260000h-26ffffh 38 250000h-25ffffh 37 240000h-24ffffh 36 230000h-23ffffh 35 220000h-22ffffh 34 210000h-21ffffh 33 200000h-20ffffh 32 1f0000h-1fffffh 31 1e0000h-1effffh 30 1d0000h-1dffffh 29 1c0000h-1cffffh 28 1b0000h-1bffffh 27 1a0000h-1affffh 26 190000h-19ffffh 25 180000h-18ffffh 24 170000h-17ffffh 23 160000h-16ffffh 22 150000h-15ffffh 21 140000h-14ffffh 20 130000h-13ffffh 19 120000h-12ffffh 18 110000h-11ffffh 17 100000h-10ffffh 16 0f0000h-0fffffh 15 0e0000h-0effffh 14 0d0000h-0dffffh 13 0c0000h-0cffffh 12 0b0000h-0bffffh 11 0a0000h-0affffh 10 090000h-09ffffh 9 080000h-08ffffh 8 070000h-07ffffh 7 060000h-06ffffh 6 050000h-05ffffh 5 040000h-04ffffh 4 030000h-03ffffh 3 020000h-02ffffh 2 010000h-01ffffh 1 000000h-00ffffh block number address range (x16 bus width)
m58lw064c 46/61 appendix b. common flash interface - cfi the common flash interface is a jedec ap- proved, standardized data structure that can be read from the flash memory device. it allows a system software to query the device to determine various electrical and timing parameters, density information and functions supported by the mem- ory. the system can interface easily with the de- vice, enabling the software to upgrade itself when necessary. when the cfi query command (rcfi) is issued the device enters cfi query mode and the data structure is read from the memory. tables 26 , 27 , 28 , 29 , 30 and 31 show the addresses used to re- trieve the data. table 26. query structure overview note: 1. offset 15h defines p which points to the primary algorithm extended query address table. 2. offset 19h defines a which points to the al ternate algorithm extended query address table. 3. sba is the start base address for each block. table 27. cfi - query address and data output note: 1. query data are always presented on dq7-dq0. dq15-dq8 are set to '0'. 2. offset 19h defines a which points to the al ternate algorithm extended query address table. offset sub-section name description 00h manufacturer code 01h device code 10h cfi query identification string command set id and algorithm data offset 1bh system interface information device timing and voltage information 27h device geometry definition flash memory layout p(h) (1) primary algorithm-specific extended query table additional information specific to the primary algorithm (optional) a(h) (2) alternate algorithm-specific extended query table additional information specific to the alternate algorithm (optional) (sba+02)h block status register block-related information address a22-a1 data instruction 10h 51h "q" 51h; "q" query ascii string 52h; "r" 59h; "y" 11h 52h "r" 12h 59h "y" 13h 01h primary vendor: command set and control interface id code 14h 00h 15h 31h primary algorithm extended query address table: p(h) 16h 00h 17h 00h alternate vendor: command set and control interface id code 18h 00h 19h 00h alternate algorithm extended query address table 1ah (2) 00h
47/61 m58lw064c table 28. cfi - device voltage and timing specification note: 1. bits are coded in binary code decimal, bit7 to bit4 are scaled in volts and bit3 to bit0 in mv. 2. bit7 to bit4 are coded in hexadecimal and scaled in volts while bit3 to bit0 are in binary code decimal and scaled in 100mv. 3. not supported. table 29. device geometry definition address a22-a1 data description 1bh 27h (1) v dd min, 2.7v 1ch 36h (1) v dd max, 3.6v 1dh 00h (2) v pp min ? not available 1eh 00h (2) v pp max ? not available 1fh 04h 2 n s typical time-out for word, dword prog ? not available 20h 08h 2 n s, typical time-out for max buffer write 21h 0ah 2 n ms, typical time-out for erase block 22h 00h (3) 2 n ms, typical time-out for chip erase ? not available 23h 04h 2 n x typical for word dword time-out max ? not available 24h 04h 2 n x typical for buffer write time-out max 25h 04h 2 n x typical for individual block erase time-out maximum 26h 00h (3) 2 n x typical for chip erase max time-out ? not available address a22-a1 data description 27h 17h n where 2 n is number of bytes memory size 28h 01h device interface 29h 00h organization sync./async. 2ah 05h maximum number of bytes in write buffer, 2 n 2bh 00h 2ch 01h bit7-0 = number of erase block regions in device 2dh 3fh number (n-1) of erase blocks of identical size; n=64 2eh 00h 2fh 00h erase block region information x 256 bytes per erase block (128k bytes) 30h 02h
m58lw064c 48/61 table 30. block status register note: 1. ba specifies the block address location, a22-a17. 2. not supported. address a22-a1 data selected block information (ba+2)h (1) bit0 0 block unprotected 1 block protected bit1 0 last erase operation ended successfully (2) 1 last erase operation not ended successfully (2) bit7-2 0 reserved for future features
49/61 m58lw064c table 31. extended query information note: 1. bit7 to bit4 are coded in hexadecimal and scaled in volt while bit3 to bit0 are in binary code decimal and scaled in mv. address offset address a22-a2 data (hex) x16 bus width description (p)h 31h 50h "p" query ascii string - extended table (p+1)h 32h 52h "r" (p+2)h 33h 49h "i" (p+3)h 34h 31h major version number (p+4)h 35h 31h minor version number (p+5)h 36h ceh optional feature: (1=yes, 0=no) bit0, chip erase supported (0=no) bit1, suspend erase supported (1=yes) bit2, suspend program supported (1=yes) bit3, protect/unprotect supported (1=yes) bit4, queue erase supported (0=no) bit5, instant individual block locking (0=no) bit6, protection bits supported (1=yes) bit7, page read supported (1=yes) bit8, synchronous read supported (1=yes) bits 9 to 31 reserved for future use (p+6)h 37h 01h (p+7)h 38h 00h (p+8)h 39h 00h (p+9)h 3ah 01h function allowed after suspend: program allowed after erase suspend (1=yes) bit 7-1 reserved for future use (p+a)h 3bh 01h block status register bit0, block protect bit status active (1=yes) bit1, block lock-down bit status active (not available) bits 2 to 15 reserved for future use (p+b)h 3ch 00h (p+c)h 3dh 33h v dd optimum program/erase voltage conditions (p+d)h 3eh 00h v pp optimum program/erase voltage conditions (p+e)h 3fh 01h otp protection: no. of protection register fields (p+f)h 40h 80h protection register?s start address, least significant bits (p+10)h 41h 00h protection register?s start address, most significant bits (p+11)h 42h 03h n where 2 n is number of factory reprogrammed bytes (p+12)h 43h 03h n where 2 n is number user programmable bytes (p+13)h 44h 03h page read: 2 n bytes (n = bits 0-7) (p+14)h 45h 03h synchronous mode configuration fields (p+15)h 46h 01h n where 2 n+1 is the number of words for the burst length = 4 (p+16)h 47h 02h n where 2 n+1 is the number of words for the burst length = 8 (p+17)h 48h 07h burst continuous
m58lw064c 50/61 appendix c. flow charts figure 23. write to buffer and program flowchart and pseudo code write to buffer e8h command, block address ai06232b start read status register no sr7 = 1 write buffer data, start address yes x = n yes no end no write to buffer timeout write n (1) , block address yes x = 0 write next buffer data, next program address (2) x = x + 1 program buffer to flash confirm d0h read status register no sr7 = 1 yes full status register check (3) try again later note 1: n+1 is number of words to be programmed note 2: next program address must have same a5-a22. note 3: a full status register check must be done to check the program operation's success.
51/61 m58lw064c figure 24. program suspend & resume flowchart and pseudo code write 70h ai00612b read status register yes no sr7 = 1 yes no sr2 = 1 program continues write ffh program/erase suspend command: ? write b0h ? write 70h do: ? read status register while sr7 = 1 if sr2 = 0, program completed read memory array command: ? write ffh ? one or more data reads from other blocks write d0h program erase resume command: ? write d0h to resume erasure ? if the program operation completed then this is not necessary. the device returns to read array as normal (as if the program/erase suspend command was not issued). read data from another block start write b0h program complete write ffh read data
m58lw064c 52/61 figure 25. erase flowchart and pseudo code note: 1. if an error is found, the status register must be cleared (clear status register command) before further program or eras e opera- tions. write 20h ai00613c start write d0h to block address read status register yes no sr7 = 1 yes no sr3 = 0 no sr4, sr5 = 0 v pen invalid error (1) command sequence error erase command: ? write 20h ? write d0h to block address (a12-a17) (memory enters read status register after the erase command) do: ? read status register ? if program/erase suspend command given execute suspend erase loop while sr7 = 1 if sr3 = 1, v pen invalid error: ? error handler if sr4, sr5 = 1, command sequence error: ? error handler yes no sr5 = 0 erase error (1) yes no suspend suspend loop if sr5 = 1, erase error: ? error handler yes end yes no sr1 = 0 erase to protected block error if sr1 = 1, erase to protected block error: ? error handler
53/61 m58lw064c figure 26. erase suspend & resume flowchart and pseudo code write 70h ai00615b read status register yes no sr7 = 1 yes no sr6 = 1 erase continues write ffh program/erase suspend command: ? write b0h ? write 70h do: ? read status register while sr7 = 1 if sr6 = 0, erase completed read memory array command: ? write ffh ? one or more data reads from other blocks write d0h read data from another block or program start write b0h erase complete write ffh read data program/erase resume command: ? write d0h to resume the erase operation ? if the program operation completed then this is not necessary. the device returns to read mode as normal (as if the program/erase suspend was not issued).
m58lw064c 54/61 figure 27. block protect flowchart and pseudo code write 01h block address ai06157b yes no sr7 = 1 start write 60h block address write ffh read status register block protect sucessful sr3 = 1 sr4, sr5 = 1,1 sr4 = 1 v pen invalid error invalid command sequence error block protect error yes yes yes no no no block protect command ? write 60h, block adress ? write 01h, block adress do: ? read status register while sr7 = 1 if sr3 = 1, v pen invalid error read memory array command: ? write ffh if sr4 = 1, sr5 = 1 invalid command sequence error if sr4 = 1, block protect error
55/61 m58lw064c figure 28. block unprotect flowchart and pseudo code write d0h ai06158b yes no sr7 = 1 start write 60h write ffh read status register block unprotect sucessful sr3 = 1 sr4, sr5 = 1,1 sr5 = 1 v pen invalid error invalid command sequence error block unprotect error yes yes yes no no no block unprotect command ? write 60h, block adress ? write d0h, block adress do: ? read status register while sr7 = 1 if sr3 = 1, v pen invalid error read memory array command: ? write ffh if sr4 = 1, sr5 = 1 invalid command sequence error if sr5 = 1, block unprotect error
m58lw064c 56/61 figure 29. protection register program flowchart and pseudo code note: pr = protection register write pr address, pr data ai06159b yes no sr7 = 1 start write c0h write ffh read status register pr program sucessful sr1, sr4 = 0,1 v pen invalid error protection register program error protection register program error yes yes yes no no no protection register program command ? write c0h ? write protection register address, protection register data do: ? read status register while sr7 = 1 read memory array command: ? write ffh if sr1 = 0, sr4 = 1 protection register program error sr3, sr4 = 1,1 if sr3 = 1, sr4 = 1 v pen invalid error sr1, sr4 = 1,1 if sr1 = 1, sr4 = 1 program error due to protection register protection
57/61 m58lw064c figure 30. command interface and program erase controller flowchart (a) ai03618 read signature yes no 90h read status yes 70h no clear status yes 50h no program buffer load yes e8h no erase set-up yes 20h (1) no erase command error yes ffh wait for command write read array yes d0h no a b no c cfi query yes 98h no d0h yes no program command error note 1. the erase command (20h) can only be issued if the flash is not already in erase suspend.
m58lw064c 58/61 figure 31. command interface and program erase controller flowchart (b) read status yes no 70h b erase yes ready ? no a b0h no read status yes ready ? no erase suspend yes d0h read array yes erase suspended read status (read status) yes (erase resume) no read status 90h no read signature yes 98h no cfi query yes e8h no program buffer load yes c ai03619 program/erase controller status bit in the status register read status d0h yes no no program command error wait for command write ffh yes read array no
59/61 m58lw064c figure 32. command interface and program erase controller flowchart (c). read status yes no 70h b program yes ready ? no c b0h no read status yes ready ? no program suspend yes d0h read array yes program suspended read status (read status) yes no (program resume) no read status 90h no read signature yes 98h no cfi query yes ai00618 program/erase controller status bit in the status register read status read array yes no ffh wait for command write
m58lw064c 60/61 revision history table 32. document revision history date version revision details 25-feb-2002 -01 first issue (data brief) 11-mar-2002 -02 corrections to summary description (minimum write to buffer corrected and burst address advance removed). 10-jun-2002 -03 document expanded to full product preview 08-jul-2002 -04 parameter changes, figure 29 modified. 06-aug-2002 4.1 revision numbering modified: a minor revision will be indicated by incrementing the digit after the dot, and a major revision, by incrementing the digit before the dot (revision version 04 equals 4.0). word effective programming time modified. v dd , v ddq , v ss and v ssq pin descriptions modified. document status changed from product preview to preliminary data. 16-dec-2002 4.2 revision history moved to after the appendices. table 9., program, erase times and program erase endurance cycles modified. all du connections changed to nc in figure 4., tbga64 connections (top view through package) . v il max and v ih min modified in table 14., dc characteristics . block protect setup command address modified in table 5., commands . data and descriptions clarified in cfi table 31., extended query information . 18-mar-2003 5.0 document promoted to full datasheet. summary description clarified, bus operations clarified, smart protection added, read modes section added, status register and configuration register bit nomenclature modified, v pen invalid error clarified in flowcharts. lead-free packing options added to ordering information scheme. 13-aug-2004 6.0 lead-free packaging added in features summary , summary description , table 11., absolute maximum ratings . table 22., tsop56 - 56 lead plastic thin small outline, 14 x 20 mm, package mechanical data and figure 21., tsop56 - 56 lead plastic thin small outline, 14 x 20 mm, package outline updated.
61/61 m58lw064c information furnished is believed to be accurate and reliable. however, stmicroelectronics assumes no responsibility for the co nsequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of stmicroelectronics. specifications mentioned in this publicati on are subject to change without notice. this publication supersedes and replac es all information previously supplied. stmicroelectronics prod ucts are not authorized for use as critical components in life support devices or systems without express written approval of stmicroelectro nics. the st logo is a registered trademark of stmicroelectronics. ecopack is a registered trademark of stmicroelectronics. all other names are the property of their respective owners ? 2004 stmicroelectronics - all rights reserved stmicroelectronics group of companies australia - belgium - brazil - canada - china - czech republic - finland - france - germany - hong kong - india - israel - ital y - japan - malaysia - malta - morocco - singapore - spain - sweden - switzerland - united kingdom - united states of america www.st.com


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